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Release history for SYSTEM 8 Ultimate


Version 3.10

  • Inclusion of the NEW SYSTEM 8 SmartSwitch instruments

  • AMS module: New features and improvements
    • NEW AMS 3D Manual Probe Mode – Acquire signals from an IC, connector, etc using a probe and get an overall Pass or Fail. Open AMS 3-D V-I Tester, Select “Clip” in Mode. Click in the dropdown menu under Clip Size and select Manual Probe.
    • NEW AMS 1 to 1 mapping – an easier way to interface the AMS with test rigs, connectors, custom cables and more. Open AMS 3-D V-I Tester, click in the dropdown menu under Clip Size and select Auto (1 to 1)
    • NEW 3D/2D Masks can now be cleared for individual pins. To access it, right-click on a pin graph to clear the mask. Click in Store again to save a new mask.
    • The AMS now supports compare tolerances down to 1%.
    • Pulse outputs now default to +-1V.
    • The AMS 3D V-I Tester instrument now displays live compare probes differently to make it easier to see which probes are being used.
    • Improved accuracy of the current range displayed on the axis when small currents are used.
    • New colour arrangement to better match the device display.
    • NEW AMS Matrix Tester – Now shows voltage and current on the axis.


  • MIS4 module: New features and improvements
    • NEW Open additional displays for channels 1, 2 and 3. These are extendable to a secondary monitor. Click on the dotted button (...) next to “CHX” to activate.
    • NEW Maximum acquisition size for MIS4 is now 100 divisions and scales appropriately based on time base to maintain responsiveness but allow the user to see more data.
    • MIS4 DMM – Removed the “under range” flag/warning.
    • Multiple stability and performance improvements across different instruments.


  • SYSTEM 8 Ultimate and TestFlow improvements
    • NEW StartInstrument and StopInstrument functions added to the Calculator / Script Editor: users are now able to add these functions to new or existing programming scripts to start and stop instruments automatically in Run mode. Modules supported are BFL, AICT, ATM and AMS. Contact ABI if you require further information.
    • NEW Calculator layouts have been added for the user 1–4 calculators.
    • NEW Calculator – AMS_VI3D_COMPARE_RESULT and AMS_VI3D_COMPARE_PERCENTAGE added as new functions.
    • TFL Report – Improved template, now prints much better. Added the ability to change the report title from the instrument setup.
    • NEW REPORT function added to the calculator. Users can now access TFL report features from programming scripts.

Version 3.06

  • Improvements to MIS4
  • Improvements to RevEng
  • Other general software improvements

Version 3.04

  • Optimised MIS 4 module initialisation
  • Stability improvement to the MIS 4 DSO cursor
  • Various stability and functionality improvements to the RevEng instrument
  • Other general software improvements

Version 3.00

  • Inclusion of the NEW SYSTEM 8 MIS 4 instruments
  • Improvements to Help text and manual. RevEng and MIS4 sections now available
  • All languages are now at the same version
  • Issue with AMS voltage detection now corrected
  • Wider range of clips sizes and channels added to AMS

Version 2.04

  • Issue with AMS voltage detection now fixed
  • Issue with AMS allowing a clip larger than the number of channels in some circumstances now fixed
  • Issue with ATS voltage warning when used without an AICT now fixed
  • Improvements to RevEng
  • Font properties added to more controls in instrument design

Version 2.02

  • All languages are now at the same version
  • ATM board checker channel list bug now fixed
  • Spanish DMM calculator layout corrected
  • Turkish translation issue corrected for restore default buttons
  • Turkish Digital IC Tester (Simple) layout DV–I button issue corrected
  • Issue with commas in French and Spanish now fixed
  • AICT calibration corruption issue now fixed
  • Issue with ATM IC Tester controls disappearing now fixed
  • Issue with backgrounds on some controls appearing as black now fixed
  • AMS now detects voltages on pins when tests are performed with the power on to prevent damage

Version 2.00

  • Introduction of the RevEng instrument
  • Support for USB Relay Controller

Version 1.26

  • Master analysis information for AICT now available in a TestFlow

Version 1.24

  • Release for foreign versions (Spanish and French)
  • Fix for instrument elements' anchors
  • Introduction of 'global result' box for BFL, AICT and ATM (top right corner)
  • Improvements to Report Manager layout

Version 1.22

  • BFL instruments made designable
  • New instrument layouts for BFL module
  • AICT instruments made designable
  • New instrument layouts for AICT module
  • AMS instruments made designable
  • New instrument layouts for AMS module
  • New VPS and MIS instrument layouts
  • Introduction of Report Manager
  • Improvements to Instrument Designer functions (copy/paste, drag select etc.)
  • New layout for Instrument Menu Designer

Version 1.10

  • First official release




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